Gubal, A.,Chuchina, V.,Lyalkin, Y.,Mikhailovskii, V.,Yakobson, V.,Solovyev, N.,Ganeev, A.

2020

January

Depth profiling by pulsed glow discharge time-of-flight mass spectrometry with a combined hollow cathode cell

Published

35

8

1587

1596

Export Date: 19 January 2021

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85092706138&doi=10.1039%2fd0ja00088d&partnerID=40&md5=ab8ab7300ffbd345b3d09356bb53f0d6