Peer-Reviewed Journal Details

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Authors

Zhernokletov, DM and Dong, H and Brennan, B and Kim, J and Wallace, RM

Year

2012

Month

January

Journal

Title

In situ X-ray photoelectron spectroscopy characterization of Al2O3/InSb interface evolution from atomic layer deposition

Status

Published

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Volume

258

Issue

14

Start Page

5522

End Page

5525

Abstract

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Edition

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