Chakrabarti, Bhaswar and Kang, Heesoo and Brennan, Barry and Park, Tae Joo and Cantley, Kurtis D and Pirkle, Adam and McDonnell, Stephen and Kim, Jiyoung and Wallace, Robert M and Vogel, Eric M

2011

January

IEEE Transactions on Electron Devices

Investigation of Tunneling Current in $$\backslash$hbox SiO2\HfO2 Gate Stacks for Flash Memory Applications

Published

58

12

4189

4195