Hurley, Paul K and O'Connor, \'Eamon and Djara, Vladimir and Monaghan, Scott and Povey, Ian M and Long, Rathnait D and Sheehan, Brendan and Lin, Jun and McIntyre, Paul C and Brennan, Barry and others

2013

January

Ieee Transactions On Device And Materials Reliability

The Characterization and Passivation of Fixed Oxide Charges and Interface States in the Al2O3\InGaAs MOS System

Published

13

4

429

443